Tektronix TAP3500 Single-Ended Low Voltage Probe

Manufacturer: Tektronix
Model Number: TAP3500
Selecting the right probe for your application is key to attaining the best signal fidelity in your measurements. Active probes provide truer signal reproduction and fidelity for high-frequency measurements. With our ultra-low input capacitance and unique interface, the Tektronix TAP3500 3.5 GHz Active Probe, Single-Ended w/ TEKVPI Interface provides excellent high-speed electrical and mechanical performance required for today's digital system designs. Specifically designed for use and direct connection to the TekVPIā„¢ probe interface used on the DPO7000 and DPO4000 Series oscilloscopes, the Tektronix TAP3500 3.5 GHz Active Probe, Single-Ended w/ TEKVPI Interface (w/ Certificate of Traceabl achieves high-speed signal acquisition and measurement fidelity by solving three traditional problems: Lower DUT loading effects with <=0.8 pF input capacitance and 40 kOhm input resistance Versatile DUT connectivity for attaching to small SMDs Preserves oscilloscope bandwidth at the probe tip for DPO7000 and DPO4000 Series Oscilloscope models up to 3.5 GHz

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  • Outstanding Electrical Performance
  • High Probe Bandwidth
  • Fast Probe Rise Time
  • Excellent Signal Fidelity
  • <=0.8 pF Input Capacitance
  • 40 kOhm Input Resistance
  • -4 V to 4 V Input Dynamic Range
  • -10 V to 10 V DC Input Offset Range
  • /-30V (DC pkAC) Max
  • Input Voltage (Non-Destruct) Versatile Mechanical Performance
  • Small Compact Probe Head for Probing Small Geometry Circuit Elements
  • DUT Attachment Accessories Enable Connection to SMDs as Small as 0.5 mm Pitch
  • Robust Design for Reliability Easy-to-Use
  • Connects Directly to DPO7000 and DPO4000 Series Oscilloscopes Using the New TekVPI Probe Interface
  • Provides Automatic Units Scaling and Readout on the Oscilloscopes Display
  • Easy Access to Oscilloscope Probe Menu Display for Probe Status/Diagnostic Information and to Control Probe DC Offset Applications
  • Verification, Debug and Characterization of High-speed Designs
  • Signal integrity, Jitter, and Timing Analysis
  • Manufacturing Engineering and Test
  • Signals with Voltage Swings up to 8 Vp-p

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