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RTX/RTX2012HS 2012HS DECT RF Test Platform

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The RTX2012HS RF Test Platform for DECT/DECT 6.0/CAT-iq/Japan DECT supports a wide range of RF tests in connected mode. Its high-performance measurement capability makes it ideal for high-throughput manufacturing applications. Its extended measurement capabilities make it a perfect tool in the R&D environment as well.

The tester can be setup as either a handset or a base station, with added test capabilities. Used in fixed part testing, the RTX2012HS acts as a handset and the Device Under Test (DUT) acts as a base station and vice versa.

List Price: $19,912.00

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The RTX2012HS uses loop-back signalling, hence transmitting data to the DUT and receiving the looped data for RF analysis. RF Measurements: • Verification of accuracy and stability of RF carriers (TC 1 of EN 301 406)• Verification of accuracy and stability of RF carriers (TC 1 of EN 301 406)• Transmission burst• RF carrier modulation part 4: frequency drift (TC 8 part 4 of EN 301 406)• Other RF-related tests• Bit Error Ratio• Frame Error Ratio• Frequency error (FP)• Jitter• Packet delay Modulation: • PSRB - Pseudo random bit sequence, similar to the signals sent in a real-life operation• PSRB - Pseudo random bit sequence, similar to the signals sent in a real-life operation• SPSR - Static pseudo-random bit sequence• BS55 - Alternating zeroes and ones. Has the small-est deviation• BS33 - Alternating double zeroes and ones• BS0F - Four times zeroes and four times ones re-peatable• FIG31 - TBR6 test pattern1• BS20 - Twenty times ones and twenty times zeros repeatable2 RF Level: The RF output level can be adjusted “on-the-fly” for determining sensitivity of the device under test. The RF Level output range is between -100 to -40 dBm. Datasheet

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